1

Applications of energy analysis in a transmission electron microscope

CJ Rossouw, RF Egerton, MJ Whelan
Journal:
Vacuum
Année:
1976
Langue:
english
Fichier:
PDF, 826 KB
english, 1976
2

Local Thickness Measurement in TEM

Zhang, H, Egerton, RF, Malac, M
Journal:
Microscopy and Microanalysis
Année:
2010
Langue:
english
Fichier:
PDF, 761 KB
english, 2010
3

Microscopy of pentacene thin films

Qian, H, Malac, M, Egerton, RF
Journal:
Philosophical Magazine
Année:
2007
Langue:
english
Fichier:
PDF, 839 KB
english, 2007
4

Physics of Atomic-Scale Secondary-Electron Imaging

Egerton, RF, Su, D, Wall, J, Zhu, Y
Journal:
Microscopy and Microanalysis
Année:
2010
Langue:
english
Fichier:
PDF, 420 KB
english, 2010
5

Mechanisms of Radiation Damage and Electron-Beam Fabrication

Egerton, RF
Journal:
Microscopy and Microanalysis
Année:
2010
Langue:
english
Fichier:
PDF, 424 KB
english, 2010
6

An ELNES Study of SiO2 Nanowires Grown from a Patterned Reagent

Wang, F, Malac, M, Egerton, RF, Li, P, Meldrum, A, Freeman, MR
Journal:
Microscopy and Microanalysis
Année:
2006
Langue:
english
Fichier:
PDF, 234 KB
english, 2006
7

Convenient Contrast Enhancement by Hole-Free Phase Plate in a TEM

Malac, M, Kawasaki, M, Beleggia, M, Li, P, Egerton, RF
Journal:
Microscopy and Microanalysis
Année:
2010
Langue:
english
Fichier:
PDF, 977 KB
english, 2010
8

Electron Irradiation Damage of MgO Nanocube

Zhang, H, Malac, M, Egerton, RF
Journal:
Microscopy and Microanalysis
Année:
2010
Fichier:
PDF, 1.39 MB
2010